The N-2 updates the Nanometrics (or any similar Olympus BHM Microscope) to a modern film thickness metrology system. We replace the top optics and spectrometer and add a Windows 8.1 PC with our software. Works on AFT, 181, 210, 2100, and 4000 products.
- Reliable and simple to operate
- Export or save data to your network
- Included video system for position control
- No stray white light produced
- Extensive material library with ability to use Nano files
- Semiannual lamp change done in minutes with no tools
Specs:
- Standard thickness range: 30 nm - 25 µm (oxide) 1
- Optional thickness range: 30 nm - 70 µm
- Measurement spot size with 10x objective: 20 µm
- Measure time: < 1 s
1 For repeatability < 1 nm; thinner measurements possible with greater repeatability
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