System:	* Available in all modes
	Wafer Size	set wafer size or type
	Print	thickness tabular data or reflectivity graphics
	Help
	About
	Log off	enter operator, engineer, or maintenance mode by password
File:
	Save Data	save measured reflectivity
	Save Raw Data	save detector data
	Exit
Editors:
	Program	materials and parameters to measure
	Pattern	coordinates of measurement locations
	Material	refractive index data of material
	System Config	set configurable parameters
Stage:
	Move
	Reset
Override:
	Film Type	select new material to manually measure
	Substrate Type	select new substrate material
	Reflectivity	select low/mid/high to set system gain
Advanced:
	Reference
	Zero
	Measure Reflectivity
	Raw Scan
	Calculate Model