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  Foothill Instruments manufactures metrology systems for semiconductor, MEMS, optical, and related markets.

Our film thickness products are capable of measuring up to 500 microns of dielectric.

Our wafer thickness products measure thinned silicon and very thick dielectrics.

  KV-300 film thickness system
  We now manufacture and service laser interferometer metrology systems for machine tool calibration, as well as single frequency HeNe lasers formerly of Mark-Tech, Inc.   laser interferometers
© Foothill Instruments film thickness, metrology, wafer thinning, backgrind